SAE J1752/3 PDF

Measurement of Radiated Emissions from Integrated Circuits¿¿¿TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz) (Stabilized: Sep 2017)
standard by SAE International, 09/22/2017

SAE J1752/3 – Measurement of Radiated Emissions from Integrated Circuits¿¿¿TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz) (Stabilized: Sep 2017)

SAE J1752/3_201709 defines a method for measuring the electromagnetic radiation from an integrated circuit(IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port(referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in thecell as in the conventional usage but becomes a part of the cell wall.