Your shopping cart is empty!
JEDEC JEP118 PDF
Product Code:
Availability:
Availability:
product
In Stock
In Stock
$39.60
$72.00
IN TAX $39.60
IN TAX $39.60
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
| Published by | Publication Date | Number of Pages |
| JEDEC | 12/01/2018 | 28 |
Preview
JEDEC JEP118 – GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
These guidelines apply to GaAs Monolithic Microwave Integrated Circuits (MMICs) and their individual component building blocks, such as GaAs Metal-Semiconductor Field Effect Transistors (MESFETs), Pseudomorphic High Electron Mobility Transistors (PHEMTs), Heterojunction Bipolar Transistors (HBTs), resistors, and capacitors.While the procedure described in this document may be applied to other semiconductor technologies, especially those used in RF and microwave frequency analog applications, it is primarily intended for technologies based on GaAs and related III-V material systems (InP, AlGaAs, InGaAs, InGaP, GaN, etc).
Worldwide Standards PDF © 2024
Reviews (0)